Keysight i3070
Keysight i3070 is a product which more than 40 years of continuous In-Circuit Test Innovation, it’s No.1 market share, more than 10,000 systems deployed globally.
- 作为业内备受赞誉的Keysight i3070电路测试设备，已经行销超过40年，总数超过10,000台的安装量，是市场上绝对的市占率第一的产品
| Item | Keysight i3070S6 |
| Maximum channels | 1152 |
| Maximum nodes | 5184 |
| Pin Card | HybridPlus double density |
| Driver/Receiver Mux ratio | 9:2 multiplexing |
| Vector application rate | 6MPs,12MPs,20MPs |
| Logic level | -3.5V to 5V(Per Digital Channel pin programmable) |
| Logic threshold | Dual threshold |
| Slew rate | 25V/us to 275V/us |
| Digital driver/receiver offset | -30n to 100n |
| Operating system | windows 10 |
| Test generation toolset | Board Consultant/fixture consultant/test consultant |
| Board/fixture graphics display | Board Consultant/fixture consultant/test consultant |
| Circuit analysis | Automatic(IPG)with Monte carlo Simulation |
| Probe pin locator | Interactive probe/pin locator with guided probed |
| Runtime yield display | Real time FPY(First Pass Yield) display at runtime |
| Probe/fixture maintenance tools | Worse probe reporting(Reports real time fixture probe number that fails frequently) |
| Analog unpowered debug interface | Graphical user interface in spread sheet format |
| Digital/Analog powered debug interface | Push-button Debug |
| AutoDebug | AutoDebug on Analog unpowered tests, Testjet and VTEP v2.0 (VTEP, iVTEP and NPM) |
| Modular construction for flexibility/scalability | (1 to 4) Standard |
| Dual-well construction for maximum throughput | Standard |
| Failure message printer | Yes |
| Vacuum solenoids | Built-in standard |
| Analog unpowered measurement | 2,4,6 wire measurement |
| Backdriving current | 750mA |
| Backdriving test program setup | Automatic by logic family |
| Overvoltage protection | Yes |
| Capacitor discharge protection | Yes |
| Arbitrary waveform generator | Yes |
| Fixture types supported | Short wire,NoWire,Long wire |
| Repeatability | Excellent |
| Transportability | Excellent |
| Temperature compensation | AutoAdjust@Every 5 degrees celsius temperature drift/1000Hrs |
| Open/short testing | Automatic IPG |
| Analog testing | Yes |
| Vector programming | VCL and PCF |
| Vectorless testing | VTEP V2.0 and TestJet |
| Disabling analysis | Automatic(IPG) |
| Digital test pattern generator | Yes |
| Frequency measurement | 60Mhz(Beyond 60Mhz measurement possible using fixure electronics solution) |
| Multilevel disable(digital isolation) | Yes |
| High-voltage testing capability | 100V |
| Low-voltage testing capability | No limit |
| Number of analog guarding points | Unlimited |
| Worst probe report | Yes |
| First pass yield report | Yes |
| Component-level coverage report | Yes |
| Limited access tools | Yes |
| Flash 70 device programming | Yes |
| Polarity check software | Yes |
| ICT Boundary Scan | Yes |
| PanelTest for panelized PCBAS | Yes |
| No-wire fixture development software | Yes |
| Multiple board versions software | Yes |
| Dual-well sharing | Yes |
| Throughput multiplier | Yes |
| SPC quality tool | Push-button Q-stats |
SHORT WIRE FIXTURE
-短线夹具
VECTORLESS TEST(Nano-VTEP)
-最新的Nano-Vtep技术
TRUE PARALLEL TESTING
-真正的并行测试技术
BT-Basic DLL Integration
-执行DLL动态数据库
Power Monitoring Circuit
-电源监控
Fixture Power Supply
-夹具电源
DC test method for large capacitor testing
-DC测试模式测试大电容（1000uF to 30mF）
GUI Ease of use
-图像化界面、容易操作
AutoOptimizer
-自动优化测试程序
AutoDebug
-自动调试
IEEE1149.1,1149.6 Standard Boundary Scan Testing
-标准的1149.1，1149.6边界扫描测试
